產(chǎn)品名稱：場(chǎng)發(fā)射掃描電子顯微鏡
產(chǎn)品型號(hào)：Sigma 360
產(chǎn)品品牌：Zeiss 蔡司
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對(duì)斷裂的聚苯乙烯樣品表面進(jìn)行成像，以了解聚合物界面處的裂紋形成和附著力。 Sigma 560， 3 kV，60 Pa樣品倉(cāng)壓力下的NanoVP lite模式，C2D G2。
用于藥物傳遞的MSC膠囊（中空介孔二氧化硅）。背散射成像顯示了二氧化硅納米膠囊中的氧化鐵顆粒。Sigma 560，HDBSD，5 kV。
以低電壓成像的碳納米管（CNT）。Sigma 560，500 V，Inlens SE探測(cè)器。
氧化鋁（Al2O3）球體。在500 V表面信息敏感條件下高分辨率成像，可以看到燒結(jié)顆粒的表面梯度，某些梯度之間的距離僅為3 nm。Sigma 560，500 V，Inlens SE。
電池正極鋁箔顆粒表面。利用材料成分襯度識(shí)別Li-NMC上的粘合劑（較暗的材料），使用aBSD成像。
利用化學(xué)氣相沉積（CVD）技術(shù)在Si/SiO2基材上生長(zhǎng)的MoS2?2D晶體：RISE圖像呈現(xiàn)出MoS2晶體的褶皺和重疊部分（綠色）、多層（藍(lán)色）及單層（紅色）結(jié)構(gòu)，圖像寬度32?μm。
在1 kV高真空條件下，使用ETSE探測(cè)器輕松完成放射蟲(chóng)精細(xì)鏤空結(jié)構(gòu)成像，圖像寬度183 μm。
在1 kV高真空條件下對(duì)蘑菇真菌孢子成像。使用Sigma 500可以在低電壓下對(duì)這些精巧脆弱的結(jié)構(gòu)輕松成像。
使用連續(xù)切面成像技術(shù)自動(dòng)采集的3D大腦超微結(jié)構(gòu)。星形細(xì)胞（青色）被識(shí)別和分割。
在20 kV下使用YAG-BSD成像的巖石樣品，由于YAG晶體的光傳導(dǎo)性能可高速采集圖像。
硫化鎳礦石。礦物EDS面分布圖，圖像寬度3.1 mm。樣品由英國(guó)萊徹斯特大學(xué)提供。
鐵礦石礦物分析：鐵礦石礦物的拉曼光譜分析，掃描電子顯微鏡圖像和拉曼圖疊加。（赤鐵礦為紅色、藍(lán)色、綠色、橙色和粉紅色；針鐵礦為淡藍(lán)色）。
鐵礦石礦物分析，拉曼光譜：赤鐵礦光譜的差異表征了其晶體取向的不同。（赤鐵礦為紅色、藍(lán)色、綠色、橙色和粉紅色；針鐵礦為淡藍(lán)色）。
含石榴石片麻巖的定量EDS主要元素?zé)釄D（Ca），突出了關(guān)鍵礦物中的地球化學(xué)分區(qū)。
在40?Pa可變壓力模式下，使用C2D探測(cè)器輕松完成對(duì)顏料和遮光劑用非導(dǎo)電二氧化鈦顆粒的成像，圖像寬度10?μm。
在20 kV的暗場(chǎng)模式下，使用aSTEM探測(cè)器對(duì)25 – 50 nm氧化鐵顆粒成像。
在1 kV下使用aBSD對(duì)超導(dǎo)合金樣品成像。（比例尺20 μm）
氧化鋅枝晶：檢測(cè)儲(chǔ)能系統(tǒng)電極的形態(tài)變化。Sigma，ETSE，5 kV。
![可在極端條件下完成可變壓力成像]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_fracture.png/_jcr_content/renditions/original.image_file.100.100.320,0,1601,1281.file/sigma_fracture.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_fracture.png/_jcr_content/renditions/original.image_file.360.360.320,0,1601,1281.file/sigma_fracture.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_fracture.png/_jcr_content/renditions/original.image_file.768.768.320,0,1601,1281.file/sigma_fracture.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_fracture.png/_jcr_content/renditions/original.image_file.1024.1024.320,0,1601,1281.file/sigma_fracture.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_fracture.png/_jcr_content/renditions/original.image_file.1280.1280.320,0,1601,1281.file/sigma_fracture.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_fracture.png/_jcr_content/renditions/original.image_file.1281.1281.320,0,1601,1281.file/sigma_fracture.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_fracture.png/_jcr_content/renditions/original.image_file.1281.1281.320,0,1601,1281.file/sigma_fracture.png"} "可在極端條件下完成可變壓力成像")
![Gemini光學(xué)鏡筒截面示意圖，包含電子束推進(jìn)器、Inlens探測(cè)器和Gemini物鏡。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.100.100.file/sigma_objective_lens.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.360.360.file/sigma_objective_lens.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.768.768.file/sigma_objective_lens.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/sigma_objective_lens.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/sigma_objective_lens.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/sigma_objective_lens.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_objective_lens.jpg/_jcr_content/renditions/original./sigma_objective_lens.jpg"} "Gemini光學(xué)鏡筒截面示意圖")
![Sigma的Gemini 1光學(xué)鏡筒與探測(cè)器。1 Inlens探測(cè)器，SE或Duo。2 ETSE探測(cè)器、3 VPSE、4 C2D、5 aSTEM、6/7 高級(jí)EDS探測(cè)和不同的背散射探測(cè)器，如aBSD1。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.100.100.file/gemini_optical_column_with_detectors.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.360.360.file/gemini_optical_column_with_detectors.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.768.768.file/gemini_optical_column_with_detectors.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.1024.1024.file/gemini_optical_column_with_detectors.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.1280.1280.file/gemini_optical_column_with_detectors.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original.image_file.1440.1440.file/gemini_optical_column_with_detectors.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/gemini_optical_column_with_detectors.jpg/_jcr_content/renditions/original./gemini_optical_column_with_detectors.jpg"} "Gemini 1光學(xué)鏡筒與探測(cè)器截面示意圖。")
![標(biāo)準(zhǔn)VP |模式，氣體分布（粉紅色），電子束裙邊（綠色）。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-normal.png/_jcr_content/renditions/original.image_file.100.100.file/sigma_eds-normal.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-normal.png/_jcr_content/renditions/original.image_file.360.360.file/sigma_eds-normal.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-normal.png/_jcr_content/renditions/original.image_file.768.768.file/sigma_eds-normal.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-normal.png/_jcr_content/renditions/original.image_file.1024.1024.file/sigma_eds-normal.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-normal.png/_jcr_content/renditions/original./sigma_eds-normal.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-normal.png/_jcr_content/renditions/original./sigma_eds-normal.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-normal.png/_jcr_content/renditions/original./sigma_eds-normal.png"} "標(biāo)準(zhǔn)VP |模式，氣體分布（粉紅色），電子束裙邊（綠色）。")
![NanoVP lite模式，氣體分布]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-nanovp.png/_jcr_content/renditions/original.image_file.100.100.file/sigma_eds-nanovp.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-nanovp.png/_jcr_content/renditions/original.image_file.360.360.file/sigma_eds-nanovp.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-nanovp.png/_jcr_content/renditions/original.image_file.768.768.file/sigma_eds-nanovp.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-nanovp.png/_jcr_content/renditions/original.image_file.1024.1024.file/sigma_eds-nanovp.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-nanovp.png/_jcr_content/renditions/original./sigma_eds-nanovp.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-nanovp.png/_jcr_content/renditions/original./sigma_eds-nanovp.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sigma_eds-nanovp.png/_jcr_content/renditions/original./sigma_eds-nanovp.png"} "NanoVP lite模式，氣體分布")
![對(duì)聚苯乙烯樣品表面進(jìn)行斷裂，以了解聚合物界面處的裂紋形成和附著力]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/cascade_current_detector.png/_jcr_content/renditions/original.image_file.100.67.file/cascade_current_detector.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/cascade_current_detector.png/_jcr_content/renditions/original.image_file.360.240.file/cascade_current_detector.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/cascade_current_detector.png/_jcr_content/renditions/original.image_file.768.512.file/cascade_current_detector.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/cascade_current_detector.png/_jcr_content/renditions/original.image_file.1024.683.file/cascade_current_detector.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/cascade_current_detector.png/_jcr_content/renditions/original.image_file.1280.853.file/cascade_current_detector.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/cascade_current_detector.png/_jcr_content/renditions/original.image_file.1440.960.file/cascade_current_detector.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/cascade_current_detector.png/_jcr_content/renditions/original./cascade_current_detector.png"} "聚苯乙烯樣品表面")
![用于藥物傳遞的MSC膠囊（中空介孔二氧化硅）。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/bse_detector.png/_jcr_content/renditions/original.image_file.100.67.file/bse_detector.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/bse_detector.png/_jcr_content/renditions/original.image_file.360.240.file/bse_detector.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/bse_detector.png/_jcr_content/renditions/original.image_file.768.512.file/bse_detector.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/bse_detector.png/_jcr_content/renditions/original.image_file.1024.683.file/bse_detector.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/bse_detector.png/_jcr_content/renditions/original.image_file.1280.853.file/bse_detector.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/bse_detector.png/_jcr_content/renditions/original.image_file.1440.960.file/bse_detector.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/bse_detector.png/_jcr_content/renditions/original./bse_detector.png"} "MSC膠囊（中空介孔二氧化硅）")
![以低電壓成像的碳納米管（CNT）。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/carbon_nanotubes.png/_jcr_content/renditions/original.image_file.100.67.file/carbon_nanotubes.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/carbon_nanotubes.png/_jcr_content/renditions/original.image_file.360.240.file/carbon_nanotubes.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/carbon_nanotubes.png/_jcr_content/renditions/original.image_file.768.512.file/carbon_nanotubes.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/carbon_nanotubes.png/_jcr_content/renditions/original.image_file.1024.683.file/carbon_nanotubes.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/carbon_nanotubes.png/_jcr_content/renditions/original.image_file.1280.853.file/carbon_nanotubes.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/carbon_nanotubes.png/_jcr_content/renditions/original.image_file.1440.960.file/carbon_nanotubes.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/carbon_nanotubes.png/_jcr_content/renditions/original./carbon_nanotubes.png"} "作為碳納米管（CNT）")
![氧化鋁（Al2O3）球體，在500 V表面信息敏感條件下高分辨率成像，可以看到燒結(jié)顆粒的表面梯度。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sintered_particles.png/_jcr_content/renditions/original.image_file.100.67.file/sintered_particles.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sintered_particles.png/_jcr_content/renditions/original.image_file.360.240.file/sintered_particles.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sintered_particles.png/_jcr_content/renditions/original.image_file.768.512.file/sintered_particles.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sintered_particles.png/_jcr_content/renditions/original.image_file.1024.683.file/sintered_particles.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sintered_particles.png/_jcr_content/renditions/original.image_file.1280.853.file/sintered_particles.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sintered_particles.png/_jcr_content/renditions/original.image_file.1440.960.file/sintered_particles.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/sintered_particles.png/_jcr_content/renditions/original./sintered_particles.png"} "氧化鋁（Al2O3）球體")
![電池正極鋁箔顆粒表面。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/li_nmc.png/_jcr_content/renditions/original.image_file.100.67.0,12,3189,2138.file/li_nmc.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/li_nmc.png/_jcr_content/renditions/original.image_file.360.240.0,12,3189,2138.file/li_nmc.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/li_nmc.png/_jcr_content/renditions/original.image_file.768.512.0,12,3189,2138.file/li_nmc.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/li_nmc.png/_jcr_content/renditions/original.image_file.1024.683.0,12,3189,2138.file/li_nmc.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/li_nmc.png/_jcr_content/renditions/original.image_file.1280.853.0,12,3189,2138.file/li_nmc.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/li_nmc.png/_jcr_content/renditions/original.image_file.1440.960.0,12,3189,2138.file/li_nmc.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/li_nmc.png/_jcr_content/renditions/original.image_file.1920.1280.0,12,3189,2138.file/li_nmc.png"} "電池正極鋁箔顆粒表面")
![利用化學(xué)氣相沉積（CVD）技術(shù)在Si/SiO2基材上生長(zhǎng)的MoS2 2D晶體：RISE圖像呈現(xiàn)出MoS2晶體的褶皺和重疊部分（綠色）、多層（藍(lán)色）及單層（紅色）結(jié)構(gòu)，圖像寬度32 μm。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/mos2_rise.jpg/_jcr_content/renditions/original.image_file.100.67.0,44,1020,724.file/mos2_rise.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/mos2_rise.jpg/_jcr_content/renditions/original.image_file.360.240.0,44,1020,724.file/mos2_rise.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/mos2_rise.jpg/_jcr_content/renditions/original.image_file.768.512.0,44,1020,724.file/mos2_rise.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/mos2_rise.jpg/_jcr_content/renditions/original.image_file.1020.680.0,44,1020,724.file/mos2_rise.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/mos2_rise.jpg/_jcr_content/renditions/original.image_file.1020.680.0,44,1020,724.file/mos2_rise.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/mos2_rise.jpg/_jcr_content/renditions/original.image_file.1020.680.0,44,1020,724.file/mos2_rise.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/mos2_rise.jpg/_jcr_content/renditions/original.image_file.1020.680.0,44,1020,724.file/mos2_rise.jpg"} "利用化學(xué)氣相沉積（CVD）技術(shù)在Si/SiO2基材上生長(zhǎng)的MoS2 2D晶體")
![在1 kV高真空條件下，使用ETSE探測(cè)器輕松完成放射蟲(chóng)精細(xì)鏤空結(jié)構(gòu)成像，圖像寬度183 μm。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/radiolarian.png/_jcr_content/renditions/original.image_file.100.67.8,0,1913,1270.file/radiolarian.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/radiolarian.png/_jcr_content/renditions/original.image_file.360.240.8,0,1913,1270.file/radiolarian.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/radiolarian.png/_jcr_content/renditions/original.image_file.768.512.8,0,1913,1270.file/radiolarian.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/radiolarian.png/_jcr_content/renditions/original.image_file.1024.683.8,0,1913,1270.file/radiolarian.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/radiolarian.png/_jcr_content/renditions/original.image_file.1280.853.8,0,1913,1270.file/radiolarian.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/radiolarian.png/_jcr_content/renditions/original.image_file.1440.960.8,0,1913,1270.file/radiolarian.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/radiolarian.png/_jcr_content/renditions/original.image_file.1905.1270.8,0,1913,1270.file/radiolarian.png"} "放射蟲(chóng)精細(xì)鏤空結(jié)構(gòu)")
![在1 kV高真空條件下對(duì)蘑菇真菌孢子成像。使用Sigma 500可以在低電壓下對(duì)這些精巧脆弱的結(jié)構(gòu)輕松成像。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/mushroom_spores.png/_jcr_content/renditions/original.image_file.100.67.0,9,1920,1289.file/mushroom_spores.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/mushroom_spores.png/_jcr_content/renditions/original.image_file.360.240.0,9,1920,1289.file/mushroom_spores.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/mushroom_spores.png/_jcr_content/renditions/original.image_file.768.512.0,9,1920,1289.file/mushroom_spores.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/mushroom_spores.png/_jcr_content/renditions/original.image_file.1024.683.0,9,1920,1289.file/mushroom_spores.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/mushroom_spores.png/_jcr_content/renditions/original.image_file.1280.853.0,9,1920,1289.file/mushroom_spores.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/mushroom_spores.png/_jcr_content/renditions/original.image_file.1440.960.0,9,1920,1289.file/mushroom_spores.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/mushroom_spores.png/_jcr_content/renditions/original.image_file.1920.1280.0,9,1920,1289.file/mushroom_spores.png"} "蘑菇孢子")
![Tricellaria inopinata]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/tricellaria_inopinata.png/_jcr_content/renditions/original.image_file.100.67.file/tricellaria_inopinata.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/tricellaria_inopinata.png/_jcr_content/renditions/original.image_file.360.240.file/tricellaria_inopinata.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/tricellaria_inopinata.png/_jcr_content/renditions/original.image_file.768.512.file/tricellaria_inopinata.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/tricellaria_inopinata.png/_jcr_content/renditions/original.image_file.1024.683.file/tricellaria_inopinata.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/tricellaria_inopinata.png/_jcr_content/renditions/original.image_file.1280.853.file/tricellaria_inopinata.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/tricellaria_inopinata.png/_jcr_content/renditions/original.image_file.1440.960.file/tricellaria_inopinata.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/tricellaria_inopinata.png/_jcr_content/renditions/original./tricellaria_inopinata.png"} "Tricellaria inopinata")
![使用連續(xù)切面成像的三維大腦超微結(jié)構(gòu)]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/3d_brain_ultrastructure_wo_scalebar.png/_jcr_content/renditions/original.image_file.100.67.34,0,3153,2079.file/3d_brain_ultrastructure_wo_scalebar.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/3d_brain_ultrastructure_wo_scalebar.png/_jcr_content/renditions/original.image_file.360.240.34,0,3153,2079.file/3d_brain_ultrastructure_wo_scalebar.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/3d_brain_ultrastructure_wo_scalebar.png/_jcr_content/renditions/original.image_file.768.512.34,0,3153,2079.file/3d_brain_ultrastructure_wo_scalebar.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/3d_brain_ultrastructure_wo_scalebar.png/_jcr_content/renditions/original.image_file.1024.683.34,0,3153,2079.file/3d_brain_ultrastructure_wo_scalebar.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/3d_brain_ultrastructure_wo_scalebar.png/_jcr_content/renditions/original.image_file.1280.853.34,0,3153,2079.file/3d_brain_ultrastructure_wo_scalebar.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/3d_brain_ultrastructure_wo_scalebar.png/_jcr_content/renditions/original.image_file.1440.960.34,0,3153,2079.file/3d_brain_ultrastructure_wo_scalebar.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/3d_brain_ultrastructure_wo_scalebar.png/_jcr_content/renditions/original.image_file.1920.1280.34,0,3153,2079.file/3d_brain_ultrastructure_wo_scalebar.png"} "使用連續(xù)切面成像的三維大腦超微結(jié)構(gòu)")
![在20 kV下使用YAG-BSD成像的巖石樣品，由于YAG晶體的光傳導(dǎo)性能可高速采集圖像。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/crystal_based_scintillator.png/_jcr_content/renditions/original.image_file.100.67.file/crystal_based_scintillator.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/crystal_based_scintillator.png/_jcr_content/renditions/original.image_file.360.240.file/crystal_based_scintillator.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/crystal_based_scintillator.png/_jcr_content/renditions/original.image_file.768.512.file/crystal_based_scintillator.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/crystal_based_scintillator.png/_jcr_content/renditions/original.image_file.1024.683.file/crystal_based_scintillator.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/crystal_based_scintillator.png/_jcr_content/renditions/original.image_file.1280.853.file/crystal_based_scintillator.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/crystal_based_scintillator.png/_jcr_content/renditions/original.image_file.1440.960.file/crystal_based_scintillator.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/crystal_based_scintillator.png/_jcr_content/renditions/original./crystal_based_scintillator.png"} "巖石樣品")
![硫化鎳礦石。礦物EDS面分布圖，圖像寬度3.1 mm。樣品由英國(guó)萊徹斯特大學(xué)提供。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/analysis_geometry.png/_jcr_content/renditions/original.image_file.100.67.file/analysis_geometry.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/analysis_geometry.png/_jcr_content/renditions/original.image_file.360.240.file/analysis_geometry.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/analysis_geometry.png/_jcr_content/renditions/original.image_file.768.512.file/analysis_geometry.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/analysis_geometry.png/_jcr_content/renditions/original.image_file.1024.683.file/analysis_geometry.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/analysis_geometry.png/_jcr_content/renditions/original.image_file.1280.853.file/analysis_geometry.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/analysis_geometry.png/_jcr_content/renditions/original.image_file.1440.960.file/analysis_geometry.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/analysis_geometry.png/_jcr_content/renditions/original./analysis_geometry.png"} "硫化鎳礦石")
![鐵礦石礦物分析：鐵礦石礦物的拉曼光譜分析，掃描電子顯微鏡圖像和拉曼圖疊加。（赤鐵礦為紅色、藍(lán)色、綠色、橙色和粉紅色；針鐵礦為淡藍(lán)色）。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_mineralogy_2.png/_jcr_content/renditions/original.image_file.100.75.file/iron_mineralogy_2.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_mineralogy_2.png/_jcr_content/renditions/original.image_file.360.270.file/iron_mineralogy_2.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_mineralogy_2.png/_jcr_content/renditions/original.image_file.768.576.file/iron_mineralogy_2.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_mineralogy_2.png/_jcr_content/renditions/original.image_file.1024.768.file/iron_mineralogy_2.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_mineralogy_2.png/_jcr_content/renditions/original.image_file.1280.960.file/iron_mineralogy_2.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_mineralogy_2.png/_jcr_content/renditions/original.image_file.1440.1080.file/iron_mineralogy_2.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_mineralogy_2.png/_jcr_content/renditions/original./iron_mineralogy_2.png"} "鐵礦石礦物分析")
![鐵礦石礦物分析，拉曼光譜：赤鐵礦光譜的差異表征了其晶體取向的不同。（赤鐵礦為紅色、藍(lán)色、綠色、橙色和粉紅色；針鐵礦為淡藍(lán)色）。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/hematite_spectra.png/_jcr_content/renditions/original.image_file.100.75.0,0,758,570.file/hematite_spectra.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/hematite_spectra.png/_jcr_content/renditions/original.image_file.360.270.0,0,758,570.file/hematite_spectra.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/hematite_spectra.png/_jcr_content/renditions/original.image_file.758.569.0,0,758,570.file/hematite_spectra.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/hematite_spectra.png/_jcr_content/renditions/original.image_file.758.569.0,0,758,570.file/hematite_spectra.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/hematite_spectra.png/_jcr_content/renditions/original.image_file.758.569.0,0,758,570.file/hematite_spectra.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/hematite_spectra.png/_jcr_content/renditions/original.image_file.758.569.0,0,758,570.file/hematite_spectra.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/hematite_spectra.png/_jcr_content/renditions/original.image_file.758.569.0,0,758,570.file/hematite_spectra.png"} "鐵礦石礦物分析，拉曼光譜")
![含石榴石片麻巖的定量EDS主要元素?zé)釄D（Ca），突出了關(guān)鍵礦物中的地球化學(xué)分區(qū)。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/element_heatmap.png/_jcr_content/renditions/original.image_file.100.75.56,0,1865,1357.file/element_heatmap.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/element_heatmap.png/_jcr_content/renditions/original.image_file.360.270.56,0,1865,1357.file/element_heatmap.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/element_heatmap.png/_jcr_content/renditions/original.image_file.768.576.56,0,1865,1357.file/element_heatmap.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/element_heatmap.png/_jcr_content/renditions/original.image_file.1024.768.56,0,1865,1357.file/element_heatmap.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/element_heatmap.png/_jcr_content/renditions/original.image_file.1280.960.56,0,1865,1357.file/element_heatmap.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/element_heatmap.png/_jcr_content/renditions/original.image_file.1440.1080.56,0,1865,1357.file/element_heatmap.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/element_heatmap.png/_jcr_content/renditions/original.image_file.1809.1357.56,0,1865,1357.file/element_heatmap.png"} "含石榴石片麻巖的定量EDS主要元素?zé)釄D（Ca），突出了關(guān)鍵礦物中的地球化學(xué)分區(qū)。")
![非導(dǎo)電二氧化鈦納米顆粒]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/titanum_dioxide.png/_jcr_content/renditions/original.image_file.100.67.file/titanum_dioxide.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/titanum_dioxide.png/_jcr_content/renditions/original.image_file.360.240.file/titanum_dioxide.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/titanum_dioxide.png/_jcr_content/renditions/original.image_file.768.512.file/titanum_dioxide.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/titanum_dioxide.png/_jcr_content/renditions/original.image_file.1024.683.file/titanum_dioxide.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/titanum_dioxide.png/_jcr_content/renditions/original.image_file.1280.853.file/titanum_dioxide.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/titanum_dioxide.png/_jcr_content/renditions/original.image_file.1440.960.file/titanum_dioxide.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/titanum_dioxide.png/_jcr_content/renditions/original./titanum_dioxide.png"} "在40 Pa可變壓力模式下，使用C2D探測(cè)器輕松完成對(duì)顏料和遮光劑用非導(dǎo)電二氧化鈦顆粒的成像，圖像寬度10 μm。")
![在20 kV的暗場(chǎng)模式下，使用aSTEM探測(cè)器對(duì)25 – 50 nm氧化鐵顆粒成像。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_oxide.png/_jcr_content/renditions/original.image_file.100.67.file/iron_oxide.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_oxide.png/_jcr_content/renditions/original.image_file.360.240.file/iron_oxide.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_oxide.png/_jcr_content/renditions/original.image_file.768.512.file/iron_oxide.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_oxide.png/_jcr_content/renditions/original.image_file.1024.683.file/iron_oxide.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_oxide.png/_jcr_content/renditions/original.image_file.1280.853.file/iron_oxide.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_oxide.png/_jcr_content/renditions/original.image_file.1440.960.file/iron_oxide.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/iron_oxide.png/_jcr_content/renditions/original./iron_oxide.png"} "氧化鐵顆粒")
![在1 kV下使用aBSD對(duì)超導(dǎo)合金樣品成像。]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/superconductor_1kv_acki.jpg/_jcr_content/renditions/original.image_file.100.67.0,56,1337,947.file/superconductor_1kv_acki.jpg","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/superconductor_1kv_acki.jpg/_jcr_content/renditions/original.image_file.360.240.0,56,1337,947.file/superconductor_1kv_acki.jpg","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/superconductor_1kv_acki.jpg/_jcr_content/renditions/original.image_file.768.512.0,56,1337,947.file/superconductor_1kv_acki.jpg","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/superconductor_1kv_acki.jpg/_jcr_content/renditions/original.image_file.1024.683.0,56,1337,947.file/superconductor_1kv_acki.jpg","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/superconductor_1kv_acki.jpg/_jcr_content/renditions/original.image_file.1280.853.0,56,1337,947.file/superconductor_1kv_acki.jpg","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/superconductor_1kv_acki.jpg/_jcr_content/renditions/original.image_file.1337.891.0,56,1337,947.file/superconductor_1kv_acki.jpg","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/applications/superconductor_1kv_acki.jpg/_jcr_content/renditions/original.image_file.1337.891.0,56,1337,947.file/superconductor_1kv_acki.jpg"} "超導(dǎo)合金樣品")
![氧化鋅枝晶]({"xsmall":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/zinc_oxide_dendrites.png/_jcr_content/renditions/original.image_file.100.67.file/zinc_oxide_dendrites.png","small":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/zinc_oxide_dendrites.png/_jcr_content/renditions/original.image_file.360.240.file/zinc_oxide_dendrites.png","medium":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/zinc_oxide_dendrites.png/_jcr_content/renditions/original.image_file.768.512.file/zinc_oxide_dendrites.png","large":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/zinc_oxide_dendrites.png/_jcr_content/renditions/original.image_file.1024.683.file/zinc_oxide_dendrites.png","xlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/zinc_oxide_dendrites.png/_jcr_content/renditions/original.image_file.1280.853.file/zinc_oxide_dendrites.png","xxlarge":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/zinc_oxide_dendrites.png/_jcr_content/renditions/original.image_file.1440.960.file/zinc_oxide_dendrites.png","max":"https://www.zeiss.com/content/dam/rms/reference-master/products/electron-ion/sem/sigma/zinc_oxide_dendrites.png/_jcr_content/renditions/original./zinc_oxide_dendrites.png"} "氧化鋅枝晶")